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Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Title
Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
Authors
Nam D.; Opanasyuk A.S.; Koval P.V.; Ponomarev A.G.; Jeong A.R.; Kim G.Y.; Jo W.; Cheong H.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2014
Journal Title
Thin Solid Films
ISSN
0040-6090JCR Link
Citation
Thin Solid Films vol. 562, pp. 109 - 113
Publisher
Elsevier
Indexed
SCI; SCIE; SCOPUS WOS scopus
Document Type
Article
Abstract
Confocal microscopy; Copper-zinc-tin selenide; Energy dispersive X-ray spectroscopy; Particle induced X-ray emission; Photoluminescence; Raman spectroscopy; Thin films; X-ray diffraction
DOI
10.1016/j.tsf.2014.03.079
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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