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dc.contributor.author조윌렴*
dc.date.accessioned2016-08-28T11:08:43Z-
dc.date.available2016-08-28T11:08:43Z-
dc.date.issued2014*
dc.identifier.issn0040-6090*
dc.identifier.otherOAK-11769*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/228120-
dc.description.abstractConfocal microscopy; Copper-zinc-tin selenide; Energy dispersive X-ray spectroscopy; Particle induced X-ray emission; Photoluminescence; Raman spectroscopy; Thin films; X-ray diffraction*
dc.languageEnglish*
dc.publisherElsevier*
dc.titleComposition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy*
dc.typeArticle*
dc.relation.volume562*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage109*
dc.relation.lastpage113*
dc.relation.journaltitleThin Solid Films*
dc.identifier.doi10.1016/j.tsf.2014.03.079*
dc.identifier.wosidWOS:000340658100016*
dc.identifier.scopusid2-s2.0-84901761637*
dc.author.googleNam D.*
dc.author.googleOpanasyuk A.S.*
dc.author.googleKoval P.V.*
dc.author.googlePonomarev A.G.*
dc.author.googleJeong A.R.*
dc.author.googleKim G.Y.*
dc.author.googleJo W.*
dc.author.googleCheong H.*
dc.contributor.scopusid조윌렴(7103322276)*
dc.date.modifydate20240123091004*
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자연과학대학 > 물리학전공 > Journal papers
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