Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 조윌렴 | * |
dc.date.accessioned | 2016-08-28T11:08:43Z | - |
dc.date.available | 2016-08-28T11:08:43Z | - |
dc.date.issued | 2014 | * |
dc.identifier.issn | 0040-6090 | * |
dc.identifier.other | OAK-11769 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/228120 | - |
dc.description.abstract | Confocal microscopy; Copper-zinc-tin selenide; Energy dispersive X-ray spectroscopy; Particle induced X-ray emission; Photoluminescence; Raman spectroscopy; Thin films; X-ray diffraction | * |
dc.language | English | * |
dc.publisher | Elsevier | * |
dc.title | Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy | * |
dc.type | Article | * |
dc.relation.volume | 562 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 109 | * |
dc.relation.lastpage | 113 | * |
dc.relation.journaltitle | Thin Solid Films | * |
dc.identifier.doi | 10.1016/j.tsf.2014.03.079 | * |
dc.identifier.wosid | WOS:000340658100016 | * |
dc.identifier.scopusid | 2-s2.0-84901761637 | * |
dc.author.google | Nam D. | * |
dc.author.google | Opanasyuk A.S. | * |
dc.author.google | Koval P.V. | * |
dc.author.google | Ponomarev A.G. | * |
dc.author.google | Jeong A.R. | * |
dc.author.google | Kim G.Y. | * |
dc.author.google | Jo W. | * |
dc.author.google | Cheong H. | * |
dc.contributor.scopusid | 조윌렴(7103322276) | * |
dc.date.modifydate | 20240123091004 | * |