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DSpace at EWHA엘텍공과대학 전자공학과 Journal papers

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Temperature dependence of electron mobility in uniaxial strained nMOSFETs

Title: Temperature dependence of electron mobility in uniaxial strained nMOSFETs

Authors: Sun W.; Shin H.

Ewha Authors: 신형순

SCOPUS Author ID: 신형순

Issue Date: 2014

Journal Title: Journal of Semiconductor Technology and Science

ISSN: 1598-1657

Citation: Journal of Semiconductor Technology and Science vol. 14, no. 2, pp. 146 - 152

Publisher: Institute of Electronics Engineers of Korea

Indexed: SCIE; SCOPUS; KCI

Document Type: Article

Abstract: Electron mobility; Intervalley phonon mobility; Intravalley phonon mobility; Strain; Stress; Temperature

DOI: 10.5573/JSTS.2014.14.2.146

Appears in Collections:: 엘텍공과대학 > 전자공학과 > Journal papers

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