Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 신형순 | * |
dc.date.accessioned | 2016-08-28T11:08:15Z | - |
dc.date.available | 2016-08-28T11:08:15Z | - |
dc.date.issued | 2014 | * |
dc.identifier.issn | 1598-1657 | * |
dc.identifier.other | OAK-11473 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/227870 | - |
dc.description.abstract | Electron mobility; Intervalley phonon mobility; Intravalley phonon mobility; Strain; Stress; Temperature | * |
dc.language | English | * |
dc.publisher | Institute of Electronics Engineers of Korea | * |
dc.title | Temperature dependence of electron mobility in uniaxial strained nMOSFETs | * |
dc.type | Article | * |
dc.relation.issue | 2 | * |
dc.relation.volume | 14 | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.index | KCI | * |
dc.relation.startpage | 146 | * |
dc.relation.lastpage | 152 | * |
dc.relation.journaltitle | Journal of Semiconductor Technology and Science | * |
dc.identifier.doi | 10.5573/JSTS.2014.14.2.146 | * |
dc.identifier.wosid | WOS:000336958100002 | * |
dc.identifier.scopusid | 2-s2.0-84900017646 | * |
dc.author.google | Sun W. | * |
dc.author.google | Shin H. | * |
dc.contributor.scopusid | 신형순(7404012125) | * |
dc.date.modifydate | 20240322125227 | * |