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Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

Title
Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy
Authors
Kim T.Y.Lee J.H.Oh Y.J.Choi M.R.Jo W.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2007
Journal Title
Applied Physics Letters
ISSN
0003-6951JCR Link
Citation
vol. 90, no. 8
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films. © 2007 American Institute of Physics.
DOI
10.1063/1.2472181
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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