Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 조윌렴 | * |
dc.date.accessioned | 2017-02-15T08:02:01Z | - |
dc.date.available | 2017-02-15T08:02:01Z | - |
dc.date.issued | 2007 | * |
dc.identifier.issn | 0003-6951 | * |
dc.identifier.other | OAK-3844 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/234255 | - |
dc.description.abstract | The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films. © 2007 American Institute of Physics. | * |
dc.language | English | * |
dc.title | Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy | * |
dc.type | Article | * |
dc.relation.issue | 8 | * |
dc.relation.volume | 90 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.journaltitle | Applied Physics Letters | * |
dc.identifier.doi | 10.1063/1.2472181 | * |
dc.identifier.wosid | WOS:000244420600056 | * |
dc.identifier.scopusid | 2-s2.0-33847219277 | * |
dc.author.google | Kim T.Y. | * |
dc.author.google | Lee J.H. | * |
dc.author.google | Oh Y.J. | * |
dc.author.google | Choi M.R. | * |
dc.author.google | Jo W. | * |
dc.contributor.scopusid | 조윌렴(7103322276) | * |
dc.date.modifydate | 20240123091004 | * |