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Microstructural properties of phase-change Ge 2Sb 2Te 5 nanoparticles grown by pulsed-laser ablation

Title
Microstructural properties of phase-change Ge 2Sb 2Te 5 nanoparticles grown by pulsed-laser ablation
Authors
Jeong A.R.Yoon H.R.Oh Y.J.Kim T.Y.Jo W.Kim M.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2009
Journal Title
Journal of Nanoscience and Nanotechnology
ISSN
1533-4880JCR Link
Citation
vol. 9, no. 2, pp. 901 - 904
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
We have introduced in-situ growth of Ge 2Sb 2Te 5 (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directly on PtIlr-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge 2Sb 2Te 5 phase which has a lattice constant with '-6 A like bulk value of face-centered cubic and hexagonal structure. Copyright © 2009 American Scientific Publishers All rights reserved.
DOI
10.1166/jnn.2009.C050
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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