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dc.contributor.author조윌렴*
dc.date.accessioned2016-10-20T02:10:38Z-
dc.date.available2016-10-20T02:10:38Z-
dc.date.issued2009*
dc.identifier.issn1533-4880*
dc.identifier.otherOAK-5425*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/232539-
dc.description.abstractWe have introduced in-situ growth of Ge 2Sb 2Te 5 (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directly on PtIlr-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge 2Sb 2Te 5 phase which has a lattice constant with '-6 A like bulk value of face-centered cubic and hexagonal structure. Copyright © 2009 American Scientific Publishers All rights reserved.*
dc.languageEnglish*
dc.titleMicrostructural properties of phase-change Ge 2Sb 2Te 5 nanoparticles grown by pulsed-laser ablation*
dc.typeConference Paper*
dc.relation.issue2*
dc.relation.volume9*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage901*
dc.relation.lastpage904*
dc.relation.journaltitleJournal of Nanoscience and Nanotechnology*
dc.identifier.doi10.1166/jnn.2009.C050*
dc.identifier.wosidWOS:000263653300050*
dc.identifier.scopusid2-s2.0-67649258752*
dc.author.googleJeong A.R.*
dc.author.googleYoon H.R.*
dc.author.googleOh Y.J.*
dc.author.googleKim T.Y.*
dc.author.googleJo W.*
dc.author.googleKim M.*
dc.contributor.scopusid조윌렴(7103322276)*
dc.date.modifydate20240123091004*
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자연과학대학 > 물리학전공 > Journal papers
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