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Interfacial reactions and resistive switching behaviors of metal/NiO/metal structures

Title
Interfacial reactions and resistive switching behaviors of metal/NiO/metal structures
Authors
Phark S.H.Jung R.Chang Y.J.Noh T.W.Kim D.-W.
Ewha Authors
김동욱
SCOPUS Author ID
김동욱scopus
Issue Date
2009
Journal Title
Applied Physics Letters
ISSN
0003-6951JCR Link
Citation
vol. 94, no. 2
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Ag/NiO/Pt structures did (did not) exhibit reproducible resistive switching when a positive bias was applied to the Pt (Ag) electrode. X-ray photoemission spectra revealed that ultrathin NiO films on Pt (Ag) layers did (did not) undergo reversible chemical state change during heat treatment in a vacuum and oxygen ambient. Such differences in interfacial chemical interaction may affect filament formation and rupture processes near the electrode and hence alter the resistive switching behaviors. © 2009 American Institute of Physics.
DOI
10.1063/1.3072800
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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