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Effects of damage caused by non-ionizing energy loss in Si Mini-Pad sensors for the PHENIX MPC-EX

Title
Effects of damage caused by non-ionizing energy loss in Si Mini-Pad sensors for the PHENIX MPC-EX
Authors
Chai J.-S.Ghergherehchi M.Hahn K.I.Han S.Y.Jeong I.W.Joo K.S.Kim E.J.Kim S.G.Kim Y.K.Kistenev E.Kwon Y.Lajoie J.G.Li Z.Lee J.H.Lim K.S.Lim S.H.Park J.M.Park K.S.Park S.Y.Song H.S.Sue D.G.Sukhanov A.
Ewha Authors
한소엽한인식
SCOPUS Author ID
한소엽scopus; 한인식scopus
Issue Date
2015
Journal Title
Journal of the Korean Physical Society
ISSN
0374-4884JCR Link
Citation
vol. 65, no. 11, pp. 1809 - 1816
Publisher
Korean Physical Society
Indexed
SCI; SCIE; SCOPUS; KCI WOS scopus
Abstract
Damage to bulk; Non-ionizing energy loss; Si Mini-Pad; W/Si pre-shower
DOI
10.3938/jkps.65.1809
Appears in Collections:
자연과학대학 > 화학·나노과학전공 > Journal papers
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