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Effects of damage caused by non-ionizing energy loss in Si Mini-Pad sensors for the PHENIX MPC-EX

Title: Effects of damage caused by non-ionizing energy loss in Si Mini-Pad sensors for the PHENIX MPC-EX

Authors: Chai J.-S.; Ghergherehchi M.; Hahn K.I.; Han S.Y.; Jeong I.W.; Joo K.S.; Kim E.J.; Kim S.G.; Kim Y.K.; Kistenev E.; Kwon Y.; Lajoie J.G.; Li Z.; Lee J.H.; Lim K.S.; Lim S.H.; Park J.M.; Park K.S.; Park S.Y.; Song H.S.; Sue D.G.; Sukhanov A.

Ewha Authors: 한소엽; 한인식

SCOPUS Author ID: 한소엽; 한인식

Issue Date: 2015

Journal Title: Journal of the Korean Physical Society

ISSN: 0374-4884

Citation: Journal of the Korean Physical Society vol. 65, no. 11, pp. 1809 - 1816

Publisher: Korean Physical Society

Indexed: SCI; SCIE; SCOPUS; KCI

Document Type: Article

Abstract: Damage to bulk; Non-ionizing energy loss; Si Mini-Pad; W/Si pre-shower

DOI: 10.3938/jkps.65.1809

Appears in Collections:: 자연과학대학 > 화학·나노과학전공 > Journal papers

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