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dc.contributor.author한소엽*
dc.contributor.author한인식*
dc.date.accessioned2016-08-28T11:08:20Z-
dc.date.available2016-08-28T11:08:20Z-
dc.date.issued2015*
dc.identifier.issn0374-4884*
dc.identifier.otherOAK-12326*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/228502-
dc.description.abstractDamage to bulk; Non-ionizing energy loss; Si Mini-Pad; W/Si pre-shower*
dc.languageEnglish*
dc.publisherKorean Physical Society*
dc.titleEffects of damage caused by non-ionizing energy loss in Si Mini-Pad sensors for the PHENIX MPC-EX*
dc.typeArticle*
dc.relation.issue11*
dc.relation.volume65*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.indexKCI*
dc.relation.startpage1809*
dc.relation.lastpage1816*
dc.relation.journaltitleJournal of the Korean Physical Society*
dc.identifier.doi10.3938/jkps.65.1809*
dc.identifier.wosidWOS:000347455500011*
dc.identifier.scopusid2-s2.0-84920621473*
dc.author.googleChai J.-S.*
dc.author.googleGhergherehchi M.*
dc.author.googleHahn K.I.*
dc.author.googleHan S.Y.*
dc.author.googleJeong I.W.*
dc.author.googleJoo K.S.*
dc.author.googleKim E.J.*
dc.author.googleKim S.G.*
dc.author.googleKim Y.K.*
dc.author.googleKistenev E.*
dc.author.googleKwon Y.*
dc.author.googleLajoie J.G.*
dc.author.googleLi Z.*
dc.author.googleLee J.H.*
dc.author.googleLim K.S.*
dc.author.googleLim S.H.*
dc.author.googlePark J.M.*
dc.author.googlePark K.S.*
dc.author.googlePark S.Y.*
dc.author.googleSong H.S.*
dc.author.googleSue D.G.*
dc.author.googleSukhanov A.*
dc.contributor.scopusid한소엽(7405944194)*
dc.contributor.scopusid한인식(7201832280;57205469686;57192312712)*
dc.date.modifydate20240415134453*
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자연과학대학 > 화학·나노과학전공 > Journal papers
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