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DSpace at EWHA공과대학 전자전기공학전공 Journal papers

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Depth-variant deconvolution of 3D widefield fluorescence microscopy using the penalized maximum likelihood estimation method

Title: Depth-variant deconvolution of 3D widefield fluorescence microscopy using the penalized maximum likelihood estimation method

Authors: Kim J.; An S.; Ahn S.; Kim B.

Ewha Authors: 김정태

SCOPUS Author ID: 김정태

Issue Date: 2013

Journal Title: Optics Express

ISSN: 1094-4087

Citation: Optics Express vol. 21, no. 23, pp. 27668 - 27681

Indexed: SCI; SCIE; SCOPUS

Document Type: Article

DOI: 10.1364/OE.21.027668

Appears in Collections:: 공과대학 > 전자전기공학전공 > Journal papers

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