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dc.contributor.author김정태*
dc.date.accessioned2016-08-28T11:08:12Z-
dc.date.available2016-08-28T11:08:12Z-
dc.date.issued2013*
dc.identifier.issn1094-4087*
dc.identifier.otherOAK-10741*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/227265-
dc.languageEnglish*
dc.titleDepth-variant deconvolution of 3D widefield fluorescence microscopy using the penalized maximum likelihood estimation method*
dc.typeArticle*
dc.relation.issue23*
dc.relation.volume21*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage27668*
dc.relation.lastpage27681*
dc.relation.journaltitleOptics Express*
dc.identifier.doi10.1364/OE.21.027668*
dc.identifier.wosidWOS:000327494000015*
dc.identifier.scopusid2-s2.0-84888239490*
dc.author.googleKim J.*
dc.author.googleAn S.*
dc.author.googleAhn S.*
dc.author.googleKim B.*
dc.contributor.scopusid김정태(55720002700;35484385500)*
dc.date.modifydate20240322125435*
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공과대학 > 전자전기공학전공 > Journal papers
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