View : 110 Download: 0
An efficient built-in self-test algorithm for neighborhood pattern- and bit-line-sensitive faults in high-density memories
- An efficient built-in self-test algorithm for neighborhood pattern- and bit-line-sensitive faults in high-density memories
- Kang D.-C.; Park S.M.; Cho S.-B.
- Ewha Authors
- SCOPUS Author ID
- Issue Date
- Journal Title
- ETRI Journal
- ETRI Journal vol. 26, no. 6, pp. 520 - 534
- SCI; SCIE; SCOPUS; KCI
- Document Type
- Conference Paper
- As the density of memories increases, unwanted interference between cells and the coupling noise between bit-lines become significant, requiring parallel testing. Testing high-density memories for a high degree of fault coverage requires either a relatively large number of test vectors or a significant amount of additional test circuitry. This paper proposes a new tiling method and an efficient built-in self-test (BIST) algorithm for neighborhood pattern-sensitive faults (NPSFs) and new neighborhood bit-line sensitive faults (NBLSFs). Instead of the conventional five-cell and nine-cell physical neighborhood layouts to test memory cells, a four-cell layout is utilized. This four-cell layout needs smaller test vectors, provides easier hardware implementation, and is more appropriate for both NPSFs and NBLSFs detection. A CMOS column decoder and the parallel comparator proposed by P. Mazumder are modified to implement the test procedure. Consequently, these reduce the number of transistors used for a BIST circuit Also, we present algorithm properties such as the capability to detect stuck-at faults, transition faults, conventional pattern-sensitive faults, and neighborhood bit-line sensitive faults.
- Appears in Collections:
- 엘텍공과대학 > 전자공학과 > Journal papers
- Files in This Item:
There are no files associated with this item.
- RIS (EndNote)
- XLS (Excel)
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.