Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성민 | * |
dc.date.accessioned | 2016-08-28T11:08:47Z | - |
dc.date.available | 2016-08-28T11:08:47Z | - |
dc.date.issued | 2004 | * |
dc.identifier.issn | 1225-6463 | * |
dc.identifier.other | OAK-2505 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/219508 | - |
dc.description.abstract | As the density of memories increases, unwanted interference between cells and the coupling noise between bit-lines become significant, requiring parallel testing. Testing high-density memories for a high degree of fault coverage requires either a relatively large number of test vectors or a significant amount of additional test circuitry. This paper proposes a new tiling method and an efficient built-in self-test (BIST) algorithm for neighborhood pattern-sensitive faults (NPSFs) and new neighborhood bit-line sensitive faults (NBLSFs). Instead of the conventional five-cell and nine-cell physical neighborhood layouts to test memory cells, a four-cell layout is utilized. This four-cell layout needs smaller test vectors, provides easier hardware implementation, and is more appropriate for both NPSFs and NBLSFs detection. A CMOS column decoder and the parallel comparator proposed by P. Mazumder are modified to implement the test procedure. Consequently, these reduce the number of transistors used for a BIST circuit Also, we present algorithm properties such as the capability to detect stuck-at faults, transition faults, conventional pattern-sensitive faults, and neighborhood bit-line sensitive faults. | * |
dc.language | English | * |
dc.title | An efficient built-in self-test algorithm for neighborhood pattern- and bit-line-sensitive faults in high-density memories | * |
dc.type | Conference Paper | * |
dc.relation.issue | 6 | * |
dc.relation.volume | 26 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.index | KCI | * |
dc.relation.startpage | 520 | * |
dc.relation.lastpage | 534 | * |
dc.relation.journaltitle | ETRI Journal | * |
dc.identifier.wosid | WOS:000225780400003 | * |
dc.identifier.scopusid | 2-s2.0-10844239996 | * |
dc.author.google | Kang D.-C. | * |
dc.author.google | Park S.M. | * |
dc.author.google | Cho S.-B. | * |
dc.contributor.scopusid | 박성민(7501832231) | * |
dc.date.modifydate | 20240322125443 | * |