Showing results 8 to 10 of 10
Issue Date | Title | Author(s) | Type |
---|---|---|---|
2002 | Investigation of noise characteristics of pn diodes by using a device simulator | 신형순 | Conference Paper |
2001 | Low-frequency noise degradation caused by STI interface effects in SOI-MOSFETs | 신형순 | Article |
2002 | Reduction of reverse short-channel effect in high-energy implanted retrograde well | 신형순 | Conference Paper |