Results 1-2 of 2 (Search time: 0.0 seconds).
Issue Date | Title | Author(s) | Type |
---|---|---|---|
2001 | Low-frequency noise degradation caused by STI interface effects in SOI-MOSFETs | 신형순 | Article |
2001 | Three-dimensional simulation of discrete oxide charge effects in 0.1 μm MOSFETs | 신형순 | Article |