Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 황의원 | * |
| dc.date.accessioned | 2025-12-24T16:30:51Z | - |
| dc.date.available | 2025-12-24T16:30:51Z | - |
| dc.date.issued | 2025 | * |
| dc.identifier.issn | 1539-9087 | * |
| dc.identifier.issn | 1558-3465 | * |
| dc.identifier.other | OAK-38299 | * |
| dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/273518 | - |
| dc.description.abstract | Undetected out-of-distribution (OOD) inputs pose a significant threat to the reliability of deep learning models, as they may lead to unexpected behaviors during inference. Several studies have proposed effective OOD input detection methods. However, soft errors-another significant threat to reliability-can impact both the classification results of neural network models and the ID/OOD detections of OOD detection methods. To provide a resilient OOD detection solution against soft errors, we analyze the effect of soft errors on neural network models with gradient-based input perturbation (GIP) approaches, which are representative methods for OOD detection. Building on our analysis, we propose ProGIP, which incorporates two software-level range-based fault detectors to protect all execution phases of GIP approaches, including two forward passes and one backward pass. Because it is purely software-based and adds just two scalar comparisons, ProGIP is readily deployable even on resource-constrained embedded platforms. Our ProGIP solution enables GIP approaches to distinguish between ID, OOD, and fault-affected inferences, detecting 97.7% of critical faults with a negligible runtime overhead of only 0.84%. Experimental results with 2.4 million fault injections across various neural networks and OOD detection methods demonstrate ProGIP's effectiveness in ensuring comprehensive reliability against non-malicious threats. | * |
| dc.language | English | * |
| dc.publisher | ASSOC COMPUTING MACHINERY | * |
| dc.subject | Soft error | * |
| dc.subject | transient fault | * |
| dc.subject | out-of-distribution (OOD) | * |
| dc.subject | reliability | * |
| dc.subject | fault tolerance | * |
| dc.subject | neural network | * |
| dc.title | ProGIP: Protecting Gradient-Based Input Perturbation Approaches for OOD Detection from Soft Errors | * |
| dc.type | Article | * |
| dc.relation.issue | 5 | * |
| dc.relation.volume | 24 | * |
| dc.relation.index | SCIE | * |
| dc.relation.index | SCOPUS | * |
| dc.relation.journaltitle | ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS | * |
| dc.identifier.doi | 10.1145/3761796 | * |
| dc.identifier.wosid | WOS:001607187000007 | * |
| dc.identifier.scopusid | 2-s2.0-105018573797 | * |
| dc.author.google | Joshi, Sumedh Shridhar | * |
| dc.author.google | So, Hwisoo | * |
| dc.author.google | Park, Soyeong | * |
| dc.author.google | Ko, Woobin | * |
| dc.author.google | Jung, Jinhyo | * |
| dc.author.google | Ko, Yohan | * |
| dc.author.google | Hwang, Uiwon | * |
| dc.author.google | Lee, Kyoungwoo | * |
| dc.author.google | Shrivastava, Aviral | * |
| dc.contributor.scopusid | 황의원(57207310001) | * |
| dc.date.modifydate | 20260818161908 | * |