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dc.contributor.author황의원*
dc.date.accessioned2025-12-24T16:30:51Z-
dc.date.available2025-12-24T16:30:51Z-
dc.date.issued2025*
dc.identifier.issn1539-9087*
dc.identifier.issn1558-3465*
dc.identifier.otherOAK-38299*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/273518-
dc.description.abstractUndetected out-of-distribution (OOD) inputs pose a significant threat to the reliability of deep learning models, as they may lead to unexpected behaviors during inference. Several studies have proposed effective OOD input detection methods. However, soft errors-another significant threat to reliability-can impact both the classification results of neural network models and the ID/OOD detections of OOD detection methods. To provide a resilient OOD detection solution against soft errors, we analyze the effect of soft errors on neural network models with gradient-based input perturbation (GIP) approaches, which are representative methods for OOD detection. Building on our analysis, we propose ProGIP, which incorporates two software-level range-based fault detectors to protect all execution phases of GIP approaches, including two forward passes and one backward pass. Because it is purely software-based and adds just two scalar comparisons, ProGIP is readily deployable even on resource-constrained embedded platforms. Our ProGIP solution enables GIP approaches to distinguish between ID, OOD, and fault-affected inferences, detecting 97.7% of critical faults with a negligible runtime overhead of only 0.84%. Experimental results with 2.4 million fault injections across various neural networks and OOD detection methods demonstrate ProGIP's effectiveness in ensuring comprehensive reliability against non-malicious threats.*
dc.languageEnglish*
dc.publisherASSOC COMPUTING MACHINERY*
dc.subjectSoft error*
dc.subjecttransient fault*
dc.subjectout-of-distribution (OOD)*
dc.subjectreliability*
dc.subjectfault tolerance*
dc.subjectneural network*
dc.titleProGIP: Protecting Gradient-Based Input Perturbation Approaches for OOD Detection from Soft Errors*
dc.typeArticle*
dc.relation.issue5*
dc.relation.volume24*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.journaltitleACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS*
dc.identifier.doi10.1145/3761796*
dc.identifier.wosidWOS:001607187000007*
dc.identifier.scopusid2-s2.0-105018573797*
dc.author.googleJoshi, Sumedh Shridhar*
dc.author.googleSo, Hwisoo*
dc.author.googlePark, Soyeong*
dc.author.googleKo, Woobin*
dc.author.googleJung, Jinhyo*
dc.author.googleKo, Yohan*
dc.author.googleHwang, Uiwon*
dc.author.googleLee, Kyoungwoo*
dc.author.googleShrivastava, Aviral*
dc.contributor.scopusid황의원(57207310001)*
dc.date.modifydate20260818161908*
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