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dc.contributor.author조성재*
dc.date.accessioned2024-02-15T05:11:56Z-
dc.date.available2024-02-15T05:11:56Z-
dc.date.issued2023*
dc.identifier.issn0021-9606*
dc.identifier.otherOAK-34398*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/267807-
dc.description.abstractBipolar gradual resistive switching was investigated in ITO/InGaZnO/ITO resistive switching devices. Controlled intrinsic oxygen vacancy formation inside the switching layer enabled the establishment of a stable multilevel memory state, allowing for RESET voltage control and non-degradable data endurance. The ITO/InGaZnO interface governs the migration of oxygen ions and redox reactions within the switching layer. Voltage-stress-induced electron trapping and oxygen vacancy formation were observed before conductive filament electroforming. This device mimicked biological synapses, demonstrating short- and long-term potentiation and depression through electrical pulse sequences. Modulation of post-synaptic currents and pulse frequency-dependent short-term potentiation were successfully emulated in the InGaZnO-based artificial synapse. The ITO/InGaZnO/ITO memristor exhibited spike-amplitude-dependent plasticity, spike-rate-dependent plasticity, and potentiation-depression synaptic learning with low energy consumption, making it a promising candidate for large-scale integration. © 2023 Author(s).*
dc.languageEnglish*
dc.publisherAmerican Institute of Physics Inc.*
dc.titleUniform multilevel switching and synaptic properties in RF-sputtered InGaZnO-based memristor treated with oxygen plasma*
dc.typeArticle*
dc.relation.issue18*
dc.relation.volume159*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.journaltitleJournal of Chemical Physics*
dc.identifier.doi10.1063/5.0179314*
dc.identifier.wosidWOS:001104453300003*
dc.identifier.scopusid2-s2.0-85176591014*
dc.author.googleMahata*
dc.author.googleChandreswar*
dc.author.googleSo*
dc.author.googleHyojin*
dc.author.googleYang*
dc.author.googleSeyeong*
dc.author.googleIsmail*
dc.author.googleMuhammad*
dc.author.googleKim*
dc.author.googleSungjun*
dc.author.googleCho*
dc.author.googleSeongjae*
dc.contributor.scopusid조성재(13607031400)*
dc.date.modifydate20240322130739*
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공과대학 > 전자전기공학전공 > Journal papers
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