Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조윌렴 | * |
| dc.date.accessioned | 2019-06-04T16:30:09Z | - |
| dc.date.available | 2019-06-04T16:30:09Z | - |
| dc.date.issued | 2019 | * |
| dc.identifier.issn | 1226-086X | * |
| dc.identifier.other | OAK-24827 | * |
| dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/249923 | - |
| dc.description.abstract | We investigated the characteristics of Cu(In, Ga)Se 2 solar cells with bandgap (E g ) grading. Two precursor types were employed: Mo/Cu 0.75 Ga 0.25 /In/Ga 2 Se 3 (CIGSe-1) and Mo/Cu/In/Ga 2 Se 3 (CIGSe-2). In CIGSe-1, the range of depths with a high Ga content is wider than that in CIGSe-2; thus, the region in which the main electron-trapping clusters and high-population deep donor defects can form is larger, and the defect density is higher. In the defect energy level range, various other defects and defect clusters exist with a defect density of 2.83 × 10 15 cm −3 within the CIGS-1 absorber layer and 2.37 × 10 15 cm −3 within the CIGS-2 absorber layer. The average efficiency values are 5.71% for CIGSe-1 and 6.82% for CIGSe-2. Additionally, the average V OC deficit (E g /q − V OC ) values are 0.758 V for CIGSe-1 and 0.731 V for CIGSe-2. As a result, in the 7 CIGSe-2 samples, the open-circuit voltage and efficiencies are improved. Thus, it is demonstrated that appropriate E g grading in a CIGSe layer with a wider E g on the back surface can result in improved performance. © 2019 The Korean Society of Industrial and Engineering Chemistry | * |
| dc.language | English | * |
| dc.publisher | Korean Society of Industrial Engineering Chemistry | * |
| dc.subject | Bandgap grading | * |
| dc.subject | CIGSe | * |
| dc.subject | Defect | * |
| dc.subject | Solar cell | * |
| dc.subject | Surface potential | * |
| dc.title | The characteristics of Cu(In, Ga)Se 2 thin-film solar cells by bandgap grading | * |
| dc.type | Article | * |
| dc.relation.volume | 76 | * |
| dc.relation.index | SCIE | * |
| dc.relation.index | SCOPUS | * |
| dc.relation.index | KCI | * |
| dc.relation.startpage | 437 | * |
| dc.relation.lastpage | 442 | * |
| dc.relation.journaltitle | Journal of Industrial and Engineering Chemistry | * |
| dc.identifier.doi | 10.1016/j.jiec.2019.04.010 | * |
| dc.identifier.wosid | WOS:000470939700040 | * |
| dc.identifier.scopusid | 2-s2.0-85064501449 | * |
| dc.author.google | Kim Y.-I. | * |
| dc.author.google | Yang K.-J. | * |
| dc.author.google | Kim S.-Y. | * |
| dc.author.google | Kang J.-K. | * |
| dc.author.google | Kim J. | * |
| dc.author.google | Jo W. | * |
| dc.author.google | Yoo H. | * |
| dc.author.google | Kim D.-H. | * |
| dc.contributor.scopusid | 조윌렴(7103322276) | * |
| dc.date.modifydate | 20260618120239 | * |