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Raman study on the effects of annealing atmosphere of patterned graphene

Title
Raman study on the effects of annealing atmosphere of patterned graphene
Authors
Son J.Choi M.Hong J.Yang I.-S.
Ewha Authors
양인상
SCOPUS Author ID
양인상scopus
Issue Date
2018
Journal Title
Journal of Raman Spectroscopy
ISSN
0377-0486JCR Link
Citation
Journal of Raman Spectroscopy vol. 49, no. 1, pp. 183 - 188
Keywords
annealing effectdefectsdeformationpatterned graphenevoids
Publisher
John Wiley and Sons Ltd
Indexed
SCIE; SCOPUS WOS scopus
Document Type
Article
Abstract
Despite extensive research on graphene, there are still lacks of understanding the structural changes under harsh stress environments such as high current in uncontrolled atmosphere. Investigating the structural changes of graphene patterned into device at high temperature would be important as the electrical current path of graphene becomes narrower and thus stronger in heat dissipation. In this paper, we performed a comparative study of the structural and electronical changes of graphene for as-grown graphene and patterned graphene in a microbridge shape heated up to 500 °C in air or Ar. While the as-grown graphene heated in air or Ar was nearly free from the structural changes, the microbridge graphene exhibited strong structural changes after annealing in Ar, i.e. the broadening in the G and the 2D peaks remained even after cooling back to 30 °C. On the other hand, the microbridge graphene heated in air was observed to release stress probably due to formation of vacancies by oxygen adsorption. The different behavior of microbridge graphene heated in Ar from that of as-grown graphene in the same condition is obvious. This means that graphene in microscopic devices should be treated differently from the as-grown graphene. Copyright © 2017 John Wiley & Sons, Ltd. Copyright © 2017 John Wiley & Sons, Ltd.
DOI
10.1002/jrs.5280
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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