Electronics Letters vol. 32, no. 20, pp. 1880 - 1882
Indexed
SCI; SCIE; SCOPUS
Document Type
Article
Abstract
A model for the α-particle-induced charge collection has been developed. By accounting for the funnelling and diffusion charges separately, our model accurately describes the junction size dependence of collected charge for a wide range of junction sizes, substrate doping levels, and α-particle energies.