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자연과학대학
물리학전공
Journal papers
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Band Alignment at Au/MoS2 Contacts: Thickness Dependence of Exfoliated Flakes
Title
Band Alignment at Au/MoS2 Contacts: Thickness Dependence of Exfoliated Flakes
Authors
Sohn A.
;
Moon H.
;
Kim J.
;
Seo M.
;
Min K.-A.
;
Lee S.W.
;
Yoon S.
;
Hong S.
;
Kim D.-W.
Ewha Authors
윤석현
;
김동욱
;
이상욱
SCOPUS Author ID
윤석현
; 김동욱
; 이상욱
Issue Date
2017
Journal Title
Journal of Physical Chemistry C
ISSN
1932-7447
Citation
Journal of Physical Chemistry C vol. 121, no. 40, pp. 22517 - 22522
Publisher
American Chemical Society
Indexed
SCIE; SCOPUS
Document Type
Article
Abstract
We investigated the surface potential (Vsurf) of exfoliated MoS2 flakes on bare and Au-coated SiO2/Si substrates using Kelvin probe force microscopy. The Vsurf of MoS2 single layers was larger on the Au-coated substrates than on the bare substrates; our theoretical calculations indicate that this may be caused by the formation of a larger electric dipole at the MoS2/Au interface leading to a modified band alignment. Vsurf decreased as the thickness of the flakes increased until reaching the bulk value at a thickness of a20 nm (a30 layers) on the bare and a80 nm (a120 layers) on the Au-coated substrates, respectively. This thickness dependence of Vsurf was attributed to electrostatic screening in the MoS2 layers. Thus, a difference in the thickness at which the bulk Vsurf appeared suggests that the underlying substrate has an effect on the electric-field screening length of the MoS2 flakes. This work provides important insights to help understand and control the electrical properties of metal/MoS2 contacts. © 2017 American Chemical Society.
DOI
10.1021/acs.jpcc.7b07511
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