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Polarization interferometry measurement of the Pockels coefficient in a chiral Bi12SiO20 single crystal
- Title
- Polarization interferometry measurement of the Pockels coefficient in a chiral Bi12SiO20 single crystal
- Authors
- Han S.H.; Wu J.W.
- Ewha Authors
- 우정원
- SCOPUS Author ID
- 우정원
- Issue Date
- 2000
- Journal Title
- IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings
- Citation
- IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings, pp. 83 - 85
- Publisher
- IEEE, Piscataway, NJ, United States
- Indexed
- SCOPUS
- Document Type
- Article
- Abstract
- Single beam polarization interferometry was introduced to measure the Pockels coefficients in a BSO single crystal. The linear superposition principle of the induced birefringence and the optical activity was employed in the analysis of the Pockels effect measurement.
- Appears in Collections:
- 자연과학대학 > 물리학전공 > Journal papers
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