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Polarization interferometry measurement of the Pockels coefficient in a chiral Bi12SiO20 single crystal

Title
Polarization interferometry measurement of the Pockels coefficient in a chiral Bi12SiO20 single crystal
Authors
Han S.H.Wu J.W.
Ewha Authors
우정원
SCOPUS Author ID
우정원scopus
Issue Date
2000
Journal Title
IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings
Citation
IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings, pp. 83 - 85
Publisher
IEEE, Piscataway, NJ, United States
Indexed
SCOPUS scopus
Document Type
Article
Abstract
Single beam polarization interferometry was introduced to measure the Pockels coefficients in a BSO single crystal. The linear superposition principle of the induced birefringence and the optical activity was employed in the analysis of the Pockels effect measurement.
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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