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dc.contributor.author조윌렴*
dc.date.accessioned2016-08-28T11:08:32Z-
dc.date.available2016-08-28T11:08:32Z-
dc.date.issued2014*
dc.identifier.issn1931-7573*
dc.identifier.otherOAK-10932*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/227439-
dc.description.abstractConductive atomic force microscopy; Cu(in; Cu2znsn(s; Ga)se2; Kelvin probe force microscopy; Kesterite; Se)4*
dc.languageEnglish*
dc.titleNanoscale observation of surface potential and carrier transport in cu2znsn(s,se)4 thin films grown by sputtering-based two-step process*
dc.typeArticle*
dc.relation.issue1*
dc.relation.volume9*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage1*
dc.relation.lastpage5*
dc.relation.journaltitleNanoscale Research Letters*
dc.identifier.doi10.1186/1556-276X-9-10*
dc.identifier.wosidWOS:000329666200001*
dc.identifier.scopusid2-s2.0-84892497386*
dc.author.googleKim G.Y.*
dc.author.googleKim J.R.*
dc.author.googleJo W.*
dc.author.googleSon D.-H.*
dc.author.googleKim D.-H.*
dc.author.googleKang J.-K.*
dc.contributor.scopusid조윌렴(7103322276)*
dc.date.modifydate20240123091004*


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