Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 조윌렴 | * |
dc.date.accessioned | 2016-08-28T12:08:22Z | - |
dc.date.available | 2016-08-28T12:08:22Z | - |
dc.date.issued | 2011 | * |
dc.identifier.issn | 0884-2914 | * |
dc.identifier.other | OAK-8067 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/222028 | - |
dc.description.abstract | We investigated microstructures, compositional distributions, and electrical properties of dielectric CaCu3Ti4O12 (CCTO) thin films deposited on Pt/TiO2/SiO2/Si substrates from 700 to 800 °C by pulsed laser deposition. With increasing the deposition temperature from 700 to 750 °C, the dielectric constants (εr) of CCTO films were greatly enhanced from ∼300 to ∼2000 at 10 kHz, respectively. However, the εr values of CCTO films were gradually decreased above 750 °C, which was surely attributable to the formation of a TiO2-rich dead layer at the interface between CCTO and Pt electrode. Compositional analyses by Auger electron spectroscopy, energy dispersive spectroscopy, and electron energy loss spectroscopy revealed that the TiO2-rich dead layer became thicker because of severe Cu diffusion from CCTO films to Pt electrode. The leakage current behaviors of CCTO films are in good agreement with Poole-Frenkel conduction mechanism, where both the TiO2-rich dead layer and rutile TiO2 nanocrystalline particles are considered to play a role of charge trapping centers. Copyright © 2011 Materials Research Society. | * |
dc.language | English | * |
dc.title | Microstructures and electrical properties of CaCu3Ti 4O12 thin films on Pt/TiO2/SiO2/Si substrates by pulsed laser deposition | * |
dc.type | Article | * |
dc.relation.issue | 19 | * |
dc.relation.volume | 26 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 2543 | * |
dc.relation.lastpage | 2551 | * |
dc.relation.journaltitle | Journal of Materials Research | * |
dc.identifier.doi | 10.1557/jmr.2011.226 | * |
dc.identifier.wosid | WOS:000296084300010 | * |
dc.identifier.scopusid | 2-s2.0-84878523480 | * |
dc.author.google | Lee S.-Y. | * |
dc.author.google | Choi S.-M. | * |
dc.author.google | Kim M.-Y. | * |
dc.author.google | Yoo S.-I. | * |
dc.author.google | Hye Lee J. | * |
dc.author.google | Jo W. | * |
dc.author.google | Kim Y.-H. | * |
dc.author.google | Choi K.J. | * |
dc.contributor.scopusid | 조윌렴(7103322276) | * |
dc.date.modifydate | 20240123091004 | * |