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dc.contributor.author김태희*
dc.date.accessioned2016-08-28T12:08:40Z-
dc.date.available2016-08-28T12:08:40Z-
dc.date.issued2009*
dc.identifier.issn1226-1750*
dc.identifier.otherOAK-6177*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/220445-
dc.description.abstractThis study examined the structure and perpendicular magnetization of FePt films grown on Pt/Fe/MgO(100) buffered Si(100) substrates by molecular beam epitaxy. The [Fe(0.17nm)/Pt(0.2nm)]N multilayers were prepared at room temperature to form a L10-FePt phase after vacuum annealing. Perpendicular magnetic anisotropy (PMA) was observed in the films after at least 15 repetitions (N = 15) of Fe/Pt deposition and annealing at 300°C for 1 hour. Careful structural analysis of the films was carried out by x-ray diffraction and high-resolution transmission electron microscopy. These results will assist in the development of the low temperature L10FePt deposition process, which will be essential for future extremely high density magnetic recording media. © 2009 Journal of Magnetics.*
dc.languageEnglish*
dc.titlePerpendicular magnetization of fept alloy films epitaxially grown on Si(100)*
dc.typeArticle*
dc.relation.issue4*
dc.relation.volume14*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.indexKCI*
dc.relation.startpage144*
dc.relation.lastpage146*
dc.relation.journaltitleJournal of Magnetics*
dc.identifier.doi10.4283/JMAG.2009.14.4.144*
dc.identifier.wosidWOS:000273262400002*
dc.identifier.scopusid2-s2.0-73649148338*
dc.author.googleAhn J.Y.*
dc.author.googleLee N.J.*
dc.author.googleKim T.H.*
dc.contributor.scopusid김태희(57212232131)*
dc.date.modifydate20240422115658*
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자연과학대학 > 물리학전공 > Journal papers
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