Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김동욱 | * |
dc.date.accessioned | 2016-08-27T04:08:34Z | - |
dc.date.available | 2016-08-27T04:08:34Z | - |
dc.date.issued | 2015 | * |
dc.identifier.issn | 2045-2322 | * |
dc.identifier.other | OAK-15010 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/217252 | - |
dc.description.abstract | We investigated the surface work function (W-S) and its spatial distribution for epitaxial VO2/TiO2 thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W-S values, throughout the metal-insulator transition. The metallic fraction, estimated from W-S maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration. | * |
dc.language | English | * |
dc.publisher | NATURE PUBLISHING GROUP | * |
dc.title | Fractal Nature of Metallic and Insulating Domain Configurations in a VO2 Thin Film Revealed by Kelvin Probe Force Microscopy | * |
dc.type | Article | * |
dc.relation.volume | 5 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.journaltitle | SCIENTIFIC REPORTS | * |
dc.identifier.doi | 10.1038/srep10417 | * |
dc.identifier.wosid | WOS:000355272800001 | * |
dc.identifier.scopusid | 2-s2.0-84929431390 | * |
dc.author.google | Sohn, Ahrum | * |
dc.author.google | Kanki, Teruo | * |
dc.author.google | Sakai, Kotaro | * |
dc.author.google | Tanaka, Hidekazu | * |
dc.author.google | Kim, Dong-Wook | * |
dc.contributor.scopusid | 김동욱(57203350633) | * |
dc.date.modifydate | 20240123114549 | * |