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dc.contributor.author조윌렴*
dc.date.accessioned2016-08-27T04:08:24Z-
dc.date.available2016-08-27T04:08:24Z-
dc.date.issued2015*
dc.identifier.issn0921-4534*
dc.identifier.issn1873-2143*
dc.identifier.otherOAK-14825*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/217149-
dc.description.abstractStructural and transport properties of high performance SmBa2Cu3O7-x coated conductors produced by a dual-chamber co-evaporation are presented. The 5 mu m-thick SmBCO coated conductors grown on IBAD-MgO based Hastelloy metal templates show critical currents larger than 1020-1560 A/cm at 77 K and self-field. The current transport characteristics of the conductors are investigated by room-temperature thermoelectric microscopy and low-temperature bolometric microscopy. The local thermoelectric images show the tilted grains, grain boundaries, and microstructural defects on the surface of the coated conductors. The bias current-dependent bolometric response at low temperature displays the current of the local flux flow dissipation as an increasing bias. Furthermore, we measured micro-Raman scattering microscopic imaging on oxygen-related peaks of the conductors. Comparing the Raman signal images with the low temperature optical scanning maps, it is remarkable that the structural disorders represented by oxygen-related Raman peaks are closely related to the low temperature bolometric abnormalities. From this result, a nature of the dissipative current distribution in coated conductors is revealed. The scanning optical microscopic study will provide a promising method for quality assurance of coated conductors. (C) 2015 Elsevier B.V. All rights reserved.*
dc.languageEnglish*
dc.publisherELSEVIER SCIENCE BV*
dc.subjectSmBCO coated conductor*
dc.subjectRoom-temperature thermoelectric microscopy*
dc.subjectLow temperature optical scanning microscopy*
dc.subjectMicro-Raman scattering spectroscopy*
dc.subjectDissipative current distribution*
dc.titleUltra-large current transport in thick SmBa2Cu3O7-x films grown by reactive co-evaporation*
dc.typeArticle*
dc.relation.volume513*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage29*
dc.relation.lastpage34*
dc.relation.journaltitlePHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS*
dc.identifier.doi10.1016/j.physc.2015.03.019*
dc.identifier.wosidWOS:000353994500007*
dc.identifier.scopusid2-s2.0-84927711652*
dc.author.googleKim, G.*
dc.author.googleJin, H. J.*
dc.author.googleJo, W.*
dc.author.googleNam, D. H.*
dc.author.googleCheong, H.*
dc.author.googleKim, H. S.*
dc.author.googleOh, S. S.*
dc.author.googleKo, R. K.*
dc.author.googleJo, Y. S.*
dc.author.googleHa, D. W.*
dc.contributor.scopusid조윌렴(7103322276)*
dc.date.modifydate20240123091004*
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자연과학대학 > 물리학전공 > Journal papers
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