Results 1-9 of 9 (Search time: 0.0 seconds).
Issue Date | Title | Author(s) | Type |
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2002 | An anomalous device degradation of SOI narrow width devices caused by STI edge influence | 신형순 | Article |
2002 | New method to extract the lateral profile of hot-carrier-induced nits by using the charge pumping method | 신형순 | Conference Paper |
2002 | Analysis of the accuracy of the local thermal noise sources for the impedance field method using the Monte Carlo method | 신형순 | Conference Paper |
2002 | Effects of shallow trench isolation on silicon-on-insulator devices for mixed signal processing | 신형순 | Conference Paper |
2002 | Reduction of reverse short-channel effect in high-energy implanted retrograde well | 신형순 | Conference Paper |
2002 | Analytical analysis of short-channel effects in MOSFETs for sub-100 nm technology | 신형순 | Article |
2002 | Quantum effects in CMOS devices | 신형순 | Conference Paper |
2002 | Investigation of noise characteristics of pn diodes by using a device simulator | 신형순 | Conference Paper |
2002 | Macro model and sense amplifier for a MRAM | 신형순 | Conference Paper |