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SAPENet: Self-Attention based Prototype Enhancement Network for Few-shot Learning

Title
SAPENet: Self-Attention based Prototype Enhancement Network for Few-shot Learning
Authors
Huang, XilangChoi, Seon Han
Ewha Authors
최선한
SCOPUS Author ID
최선한scopus
Issue Date
2023
Journal Title
PATTERN RECOGNITION
ISSN
0031-3203JCR Link

1873-5142JCR Link
Citation
PATTERN RECOGNITION vol. 135
Keywords
Few -shot learningMulti -head self -attention mechanismImage classificationk -Nearest neighbor
Publisher
ELSEVIER SCI LTD
Indexed
SCIE; SCOPUS WOS scopus
Document Type
Article
Abstract
Few-shot learning considers the problem of learning unseen categories given only a few labeled samples. As one of the most popular few-shot learning approaches, Prototypical Networks have received considerable attention owing to their simplicity and efficiency. However, a class prototype is typically obtained by averaging a few labeled samples belonging to the same class, which treats the samples as equally important and is thus prone to learning redundant features. Herein, we propose a self-attention based prototype enhancement network (SAPENet) to obtain a more representative prototype for each class. SAPENet utilizes multi-head self-attention mechanisms to selectively augment discriminative features in each sample feature map, and generates channel attention maps between intra-class sample features to attentively retain informative channel features for that class. The augmented feature maps and attention maps are finally fused to obtain representative class prototypes. Thereafter, a local descriptor-based metric module is employed to fully exploit the channel information of the prototypes by searching k similar local descriptors of the prototype for each local descriptor in the unlabeled samples for classification. We performed experiments on multiple benchmark datasets: miniImageNet, tieredImageNet, and CUB-200-2011. The experimental results on these datasets show that SAPENet achieves a considerable improvement compared to Prototypical Networks and also outperforms related state-of-the-art methods.(c) 2022 Elsevier Ltd. All rights reserved.
DOI
10.1016/j.patcog.2022.109170
Appears in Collections:
공과대학 > 전자전기공학전공 > Journal papers
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