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dc.contributor.author신형순*
dc.contributor.author선우경*
dc.date.accessioned2020-04-13T16:30:14Z-
dc.date.available2020-04-13T16:30:14Z-
dc.date.issued2020*
dc.identifier.issn1533-4880*
dc.identifier.issn1533-4899*
dc.identifier.otherOAK-26724*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/253781-
dc.description.abstractAmidst the considerable attention artificial intelligence (Al) has attracted in recent years, a neuromorphic chip that mimics the biological neuron has emerged as a promising technology. Memristor or Resistive random-access memory (RRAM) is widely used to implement a synaptic device. Recently, 3D vertical RRAM (VRRAM) has become a promising candidate to reducing resistive memory bit cost. This study investigates the operation principle of synapse in 3D VRRAM architecture. In these devices, the classification response current through a vertical pillar is set by applying a training algorithm to the memristors. The accuracy of neural networks with 3D VRRAM synapses was verified by using the HSPICE simulator to classify the alphabet in 7 x 7 character images. This simulation demonstrated that 3D VRRAMs are usable as synapses in a neural network system and that a 3D VRRAM synapse should be designed to consider the initial value of the memristor to prepare the training conditions for high classification accuracy. These results mean that a synaptic circuit using 3D VRRAM will become a key technology for implementing neural computing hardware.*
dc.languageEnglish*
dc.publisherAMER SCIENTIFIC PUBLISHERS*
dc.subjectVertical Resistive RAM*
dc.subjectNeuromorphics*
dc.subjectNeural Network Hardware*
dc.subjectGuide Training Algorithm*
dc.titleEffect of Initial Synaptic State on Pattern Classification Accuracy of 3D Vertical Resistive Random Access Memory (VRRAM) Synapses*
dc.typeArticle*
dc.relation.issue8*
dc.relation.volume20*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage4730*
dc.relation.lastpage4734*
dc.relation.journaltitleJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY*
dc.identifier.doi10.1166/jnn.2020.17798*
dc.identifier.wosidWOS:000518698800022*
dc.author.googleSun, Wookyung*
dc.author.googleChoi, Sujin*
dc.author.googleKim, Bokyung*
dc.author.googleShin, Hyungsoon*
dc.contributor.scopusid신형순(7404012125)*
dc.contributor.scopusid선우경(7404011223)*
dc.date.modifydate20240322125227*
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공과대학 > 전자전기공학전공 > Journal papers
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