Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film

Abstract

A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity of the Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r 13 and r 33.