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Local resistivity as an evaluation tool for thickness dependence of critical current density in YBa2Cu3O7-x coated conductors

Title
Local resistivity as an evaluation tool for thickness dependence of critical current density in YBa2Cu3O7-x coated conductors
Authors
Jo W.Hammond R.H.Beasley M.R.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2004
Journal Title
Physica C: Superconductivity and its Applications
ISSN
0921-4534JCR Link
Citation
Physica C: Superconductivity and its Applications vol. 412-414, no. SPEC. ISS., pp. 1030 - 1035
Indexed
SCIE; SCOPUS WOS scopus
Document Type
Conference Paper
Abstract
We report depth profiling of the critical current density and resistivity of YBa2Cu3O7-x films grown by in situ electron beam evaporation. The method is capable of providing important information on the uniformity of the films, and on the commonly observed property that the critical currents in high temperature superconductor coated conductors do not scale linearly with thickness. Local critical current density shows a clear correlation with local resistivity. Homogeneous transport properties with a large critical current density (4-5 MA/cm2 at 77 K, 0 T) are observed in top faulted region while it is found that the bottom part carries little supercurrent with a large local resistivity. Therefore, it is possible that thickness dependence of critical current density is closely related with a topological variation of good superconducting paths and/or grains in the thin film bodies. The information derived from it may be useful in the characterization and optimization of superconducting thin films for electrical power and other applications. © 2004 Elsevier B.V. All rights reserved.
DOI
10.1016/j.physc.2004.01.125
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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