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Piezoelectric and electromechanical properties of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3(65%)-PbTiO3(35%) thin films observed by scanning force microscopy

Title
Piezoelectric and electromechanical properties of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3(65%)-PbTiO3(35%) thin films observed by scanning force microscopy
Authors
Lee J.H.Oh Y.J.Kim T.Y.Choi M.R.Jo W.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2007
Journal Title
Ultramicroscopy
ISSN
0304-3991JCR Link
Citation
vol. 107, no. 41558, pp. 954 - 957
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Relaxor ferroelectric PbMg1/3Nb2/3O3(65%)-PbTiO3(35%) (PMN-35PT) thin films were grown by a sol-gel method on Pt(1 1 1)/TiO2/SiO2/Si(1 0 0) substrates. Piezoresponse and poling behavior appear to have a relation with the relaxor behavior of the materials. Piezoelectric images were studied in a number of regions on the films with subsequent statistical analysis of the obtained data using the contact mode of scanning force microscopy. Hysteresis loops were observed with external field applied over a wide range of the vibration frequency. The piezoelectric coefficient, d33, and the crystallographic electrostrictive constant, Q33, were also determined as 100 pm/V and 2.8×10-3 C-2 m4, respectively. © 2007 Elsevier B.V. All rights reserved.
DOI
10.1016/j.ultramic.2007.02.039
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자연과학대학 > 물리학전공 > Journal papers
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