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dc.contributor.author조윌렴*
dc.date.accessioned2017-02-15T08:02:38Z-
dc.date.available2017-02-15T08:02:38Z-
dc.date.issued2007*
dc.identifier.issn0003-6951*
dc.identifier.otherOAK-4210*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/234435-
dc.description.abstractThe authors report the results of retention in epitaxial and polycrystalline Pb Mg13 Nb23 O3 -PbTi O3 (PMN-PT) thin films on SrRu O3 (SRO) and Pt. The SRO electrodes were deposited by pulsed laser deposition and the PMN-PT thin films were coated by a sol-gel method. Local poling behaviors of the PMN-PT domains were investigated as a function of time in both single-poled and reverse-poled regions by scanning force microscopy. An extended exponential decay is observed in the PMN-PT/SRO heterostructures while a fluctuated relaxation is shown in the PMN-PT/Pt films, suggesting that crystal orientation and grain growth is critical to understand retention of relaxor ferroelectrics. © 2007 American Institute of Physics.*
dc.languageEnglish*
dc.titleLocal retention behaviors of epitaxial and polycrystalline Pb Mg13 Nb23 O3 -PbTi O3 thin films by scanning force microscopy*
dc.typeArticle*
dc.relation.issue7*
dc.relation.volume91*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.journaltitleApplied Physics Letters*
dc.identifier.doi10.1063/1.2769945*
dc.identifier.wosidWOS:000248866600079*
dc.identifier.scopusid2-s2.0-34548036271*
dc.author.googleLee J.H.*
dc.author.googleChoi M.R.*
dc.author.googleOh Y.J.*
dc.author.googleJo W.*
dc.contributor.scopusid조윌렴(7103322276)*
dc.date.modifydate20240123091004*
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자연과학대학 > 물리학전공 > Journal papers
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