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dc.contributor.author신형순*
dc.date.accessioned2017-01-05T02:01:17Z-
dc.date.available2017-01-05T02:01:17Z-
dc.date.issued2003*
dc.identifier.issn0013-5194*
dc.identifier.otherOAK-1587*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/233707-
dc.description.abstractUnlike the 1T1C cell of the DRAM that suffers the crucial limitation on the bit-line capacitance, the stored information in the couple of the magnetic-tunnel-junction (MTJ) cell is not related to the bit-line capacitance. To achieve the high cell efficiency for the synchronous magneto-resistive random access memory (MRAM), the unified bit-line cache scheme is proposed. It simplifies the column path and provides the low-latency column operations.*
dc.languageEnglish*
dc.titleHigh cell-efficiency synchronous MRAM adopting unified bit-line cache*
dc.typeArticle*
dc.relation.issue16*
dc.relation.volume39*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage1166*
dc.relation.lastpage1167*
dc.relation.journaltitleElectronics Letters*
dc.identifier.doi10.1049/el:20030783*
dc.identifier.wosidWOS:000184956300006*
dc.identifier.scopusid2-s2.0-0042930993*
dc.author.googleKim D.J.*
dc.author.googleKo J.H.*
dc.author.googleCho C.H.*
dc.author.googlePark Y.I.*
dc.author.googleKang D.W.*
dc.author.googleMin K.S.*
dc.author.googleKim D.M.*
dc.author.googleLee S.J.*
dc.author.googleShin H.S.*
dc.contributor.scopusid신형순(7404012125)*
dc.date.modifydate20240322125227*
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공과대학 > 전자전기공학전공 > Journal papers
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