Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 조윌렴 | * |
dc.date.accessioned | 2016-12-06T02:12:21Z | - |
dc.date.available | 2016-12-06T02:12:21Z | - |
dc.date.issued | 2008 | * |
dc.identifier.issn | 0304-3991 | * |
dc.identifier.other | OAK-5099 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/232977 | - |
dc.description.abstract | Coating of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed. © 2008 Elsevier B.V. All rights reserved. | * |
dc.language | English | * |
dc.title | Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides | * |
dc.type | Article | * |
dc.relation.issue | 10 | * |
dc.relation.volume | 108 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 1106 | * |
dc.relation.lastpage | 1109 | * |
dc.relation.journaltitle | Ultramicroscopy | * |
dc.identifier.doi | 10.1016/j.ultramic.2008.04.020 | * |
dc.identifier.wosid | WOS:000259728000024 | * |
dc.identifier.scopusid | 2-s2.0-49949098238 | * |
dc.author.google | Lee J.H. | * |
dc.author.google | Choi M.R. | * |
dc.author.google | Jo W. | * |
dc.author.google | Jang J.Y. | * |
dc.author.google | Kim M.Y. | * |
dc.contributor.scopusid | 조윌렴(7103322276) | * |
dc.date.modifydate | 20240123091004 | * |