View : 22 Download: 0

Local structural and electrical properties of ferroelectric bi325la0ti3o12 thin films on pt

Title
Local structural and electrical properties of ferroelectric bi325la0ti3o12 thin films on pt
Authors
Kim T.Y.Lee J.H.Jo W.Ko C.Han M.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2009
Journal Title
Journal of Nanoscience and Nanotechnology
ISSN
1533-4880JCR Link
Citation
vol. 9, no. 2, pp. 1246 - 1249
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Ferroelectric Bi325La075Ti3O,2 (BLT) thin films have been grown by a sol-gel method. Annealing conditions after the drying process have been explored over a wide range of temperature. BLT thin films prepared on PtJTiO2 coated Si02/Si(100) were investigated by Raman scattering spectroscopy, atomic force microscopy (AFM), and X-ray photoelectron spectroscopy. Raman spectra reveal the growth route of phase-formation of the BLT films. Ferroelectric domains in the thin films are observed by using AFM, registering the electrostatic force response of the thin films in the presence of a low ac field. It is found that the as-grown domain configuration and switching behavior are trongly dependent on growth temperature. Depth-profiling of the electronic states of Bi, Ti, and La atoms shows the oxidation during the growth. Copyright © 2009 American Scientific Publishers All rights reserved.
DOI
10.1166/jnn.2009.C130
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE