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Microscopic origin of current degradation of fully-sealed carbon-nanotube field emission display

Title
Microscopic origin of current degradation of fully-sealed carbon-nanotube field emission display
Authors
Kim S.Cho E.Han S.Cho Y.Cho S.H.Kim C.Ihm J.
Ewha Authors
한승우
Issue Date
2009
Journal Title
Solid State Communications
ISSN
0038-1098JCR Link
Citation
vol. 149, no. 17-18, pp. 670 - 672
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
The current-degradation mechanism of a fully sealed, carbon-nanotube field emission display is investigated experimentally and theoretically. From residual gas analysis, it is strongly evidenced that CH3 radicals from the organic materials in the paste deteriorate emission properties. Based on ab initio methods, it is found that CH3 radicals can increase electrical resistance of the nanotube and suppress emission currents. In addition, molecular dynamics simulations demonstrate that thermal destruction of CH3-attached nanotubes occurs at lower temperatures than for pristine nanotubes. Our results suggest that the material selection of the paste is crucial for extending the lifetime of nanotube-based field emission displays. © 2009 Elsevier Ltd. All rights reserved.
DOI
10.1016/j.ssc.2009.02.025
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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