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Ten-Micrometer-Thick Si Wafers with Ag Nanoclusters: Substrate Effects on Plasmon-Enhanced Optical Absorption
- Ten-Micrometer-Thick Si Wafers with Ag Nanoclusters: Substrate Effects on Plasmon-Enhanced Optical Absorption
- Kim, Sujung; Cho, Yunae; Sohn, Ahrum; Kim, Dong-Wook
- Ewha Authors
- SCOPUS Author ID
- Issue Date
- Journal Title
- PLASMONICS vol. 12, no. 2, pp. 405 - 410
- Silicon wafer; Ag heptamer; Anti-reflection effect; Plasmonic nanoantennae
- SCIE; SCOPUS
- Document Type
- We present the optical characteristics of 10-mu m-thick crystalline Si wafers with an Ag heptamer nanocluster (NC) array, using a finite-difference time-domain method. The anti-reflection properties of the Ag NC array were more pronounced at long wavelengths, with respect to a monomer array, resulting in significantly enhanced optical absorption in the underlying Si wafer. The scattering cross-section spectra of the NC on the Si wafer exhibited one broad peak with a kink, whereas those in air showed two broad peaks and a sharp Fano dip between them. The high refractive index Si wafer weakened the near-field coupling between particles in the NCs, which modified the optical cross-sections of the Ag NC more drastically than those of the Ag monomer. Therefore, the implementation of the NC nanoantennae for Si-based optoelectronic devices requires careful consideration of the substrate effects.
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