DSpace at EWHA: Analysis of the effect of the density of states on the characteristics of thin-film transistors

Browse

My Repository

DSpace at EWHA공과대학 전자전기공학전공 Journal papers

View : 541 Download: 0

Full metadata record

DC Field	Value	Language
dc.contributor.author	신형순	*
dc.date.accessioned	2016-08-29T12:08:38Z	-
dc.date.available	2016-08-29T12:08:38Z	-
dc.date.issued	2016	*
dc.identifier.isbn	9781479986415	*
dc.identifier.issn	2159-3442	*
dc.identifier.other	OAK-18413	*
dc.identifier.uri	https://dspace.ewha.ac.kr/handle/2015.oak/231459	-
dc.description.abstract	The effect of the density of states (DOS) on the electrical characteristics of thin-film transistors (TFTs) is investigated via an experiment and device simulations. The acceptor-like DOS of an n-type TFT was extracted based on its multi-frequency capacitance-voltage characteristics. The simulation results demonstrate that the electrical characteristics of n-type TFTs are affected not only by the acceptor-like DOS but also by the donor-like DOS. © 2015 IEEE.	*
dc.language	English	*
dc.publisher	Institute of Electrical and Electronics Engineers Inc.	*
dc.subject	acceptor-like density of states	*
dc.subject	donor-like density of states	*
dc.subject	thin-film transistors	*
dc.title	Analysis of the effect of the density of states on the characteristics of thin-film transistors	*
dc.type	Conference Paper	*
dc.relation.volume	2016-January	*
dc.relation.index	SCOPUS	*
dc.relation.journaltitle	IEEE Region 10 Annual International Conference, Proceedings/TENCON	*
dc.identifier.doi	10.1109/TENCON.2015.7372859	*
dc.identifier.scopusid	2-s2.0-84962198364	*
dc.author.google	Kim M.	*
dc.author.google	Lee I.	*
dc.author.google	Shin H.	*
dc.author.google	Shin M.-H.	*
dc.contributor.scopusid	신형순(7404012125)	*
dc.date.modifydate	20240322125227	*