DSpace at EWHA: Measurement of the linear eletro-optic, effect by reflection method in Mach-Zehnder interferometer

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DC Field	Value	Language
dc.contributor.author	우정원	-
dc.date.accessioned	2016-08-29T12:08:28Z	-
dc.date.available	2016-08-29T12:08:28Z	-
dc.date.issued	1996	-
dc.identifier.isbn	0819421642	-
dc.identifier.isbn	9780819421647	-
dc.identifier.issn	0277-786X	-
dc.identifier.other	OAK-18282	-
dc.identifier.uri	https://dspace.ewha.ac.kr/handle/2015.oak/231362	-
dc.description.sponsorship	International Commission for Optics (ICO);Optical Society of Korea (OSK);National Academy of Science;Korea Science and Engineering Foundation;Korea Researh Foundation	-
dc.language	English	-
dc.title	Measurement of the linear eletro-optic, effect by reflection method in Mach-Zehnder interferometer	-
dc.type	Conference Paper	-
dc.relation.issue	PART 2	-
dc.relation.volume	2778	-
dc.relation.index	SCOPUS	-
dc.relation.startpage	842	-
dc.relation.lastpage	843	-
dc.relation.journaltitle	Proceedings of SPIE - The International Society for Optical Engineering	-
dc.identifier.scopusid	2-s2.0-84887375780	-
dc.author.google	Shin M.J.	-
dc.author.google	Cho H.K.	-
dc.author.google	Han S.H.	-
dc.author.google	Wu J.W.	-
dc.contributor.scopusid	우정원(7409252681)	-
dc.date.modifydate	20230208103828	-