DSpace at EWHA: A dependent competing risks model for technological units subject to degradation phenomena and catastrophic failures

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DC Field	Value	Language
dc.contributor.author	차지환	*
dc.date.accessioned	2016-08-29T12:08:49Z	-
dc.date.available	2016-08-29T12:08:49Z	-
dc.date.issued	2015	*
dc.identifier.issn	0748-8017	*
dc.identifier.other	OAK-14542	*
dc.identifier.uri	https://dspace.ewha.ac.kr/handle/2015.oak/230424	-
dc.description.abstract	Catastrophic failures; Dependent competing risks; Deterministic degradation process; Mixed population	*
dc.language	English	*
dc.publisher	John Wiley and Sons Ltd	*
dc.title	A dependent competing risks model for technological units subject to degradation phenomena and catastrophic failures	*
dc.type	Article in Press	*
dc.relation.index	SCIE	*
dc.relation.index	SCOPUS	*
dc.relation.journaltitle	Quality and Reliability Engineering International	*
dc.identifier.doi	10.1002/qre.1767	*
dc.identifier.wosid	WOS:000370273700014	*
dc.identifier.scopusid	2-s2.0-84921820139	*
dc.author.google	Cha J.H.	*
dc.author.google	Pulcini G.	*
dc.contributor.scopusid	차지환(7202455739)	*
dc.date.modifydate	20231123095848	*