View : 514 Download: 0

Full metadata record

DC Field Value Language
dc.contributor.author차지환*
dc.date.accessioned2016-08-28T11:08:42Z-
dc.date.available2016-08-28T11:08:42Z-
dc.date.issued2010*
dc.identifier.isbn9780415604277*
dc.identifier.otherOAK-13751*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/229703-
dc.description.abstractIn this article, a stochastic failure model for a system operated under a randomly variable environment will be studied. The failure process of the system is assumed to depend not only on the baseline failure rate function of the system itself but also on the environmental shock process. The lifetime distribution of the system and its failure rate function will be derived. The effect of environmental factors on the failure process of the system will also be investigated. Lifetimes of systems operated under different environmental conditions are stochastically compared. © 2010 Taylor & Francis Group.*
dc.languageEnglish*
dc.titleReliability of a system subject to a random shock process*
dc.typeConference Paper*
dc.relation.indexSCOPUS*
dc.relation.startpage1033*
dc.relation.lastpage1037*
dc.relation.journaltitleReliability, Risk and Safety: Back to the Future*
dc.identifier.scopusid2-s2.0-84861691076*
dc.author.googleCha J.H.*
dc.contributor.scopusid차지환(7202455739)*
dc.date.modifydate20231123095848*
Appears in Collections:
자연과학대학 > 통계학전공 > Journal papers
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

BROWSE