Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 신형순 | * |
dc.contributor.author | 이승준 | * |
dc.date.accessioned | 2016-08-28T11:08:35Z | - |
dc.date.available | 2016-08-28T11:08:35Z | - |
dc.date.issued | 1999 | * |
dc.identifier.issn | 0018-9383 | * |
dc.identifier.other | OAK-12528 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/228655 | - |
dc.description.abstract | A new 0.1-μm MOSFET structure called asymmetric halo by large-angle-tilt implant (AHLATI) is proposed for substantial reduction of short-channel and hot-carrier effects while enhancing the current driving capability. This structure differs from the conventional devices in that it has an asymmetric channel profile with a localized pileup region next to the source junction. © 1999 IEEE. | * |
dc.language | English | * |
dc.title | An 0.1-μm asymmetric halo by large-angle-tilt implant (AHLATI) MOSFET for high performance and reliability | * |
dc.type | Article | * |
dc.relation.issue | 4 | * |
dc.relation.volume | 46 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 820 | * |
dc.relation.lastpage | 822 | * |
dc.relation.journaltitle | IEEE Transactions on Electron Devices | * |
dc.identifier.doi | 10.1109/16.753725 | * |
dc.identifier.wosid | WOS:000079394700035 | * |
dc.identifier.scopusid | 2-s2.0-0032650119 | * |
dc.author.google | Shin H. | * |
dc.author.google | Lee S. | * |
dc.contributor.scopusid | 신형순(7404012125) | * |
dc.contributor.scopusid | 이승준(36064894500;57207064952) | * |
dc.date.modifydate | 20240322125227 | * |