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dc.contributor.author신형순*
dc.contributor.author이승준*
dc.date.accessioned2016-08-28T11:08:35Z-
dc.date.available2016-08-28T11:08:35Z-
dc.date.issued1999*
dc.identifier.issn0018-9383*
dc.identifier.otherOAK-12528*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/228655-
dc.description.abstractA new 0.1-μm MOSFET structure called asymmetric halo by large-angle-tilt implant (AHLATI) is proposed for substantial reduction of short-channel and hot-carrier effects while enhancing the current driving capability. This structure differs from the conventional devices in that it has an asymmetric channel profile with a localized pileup region next to the source junction. © 1999 IEEE.*
dc.languageEnglish*
dc.titleAn 0.1-μm asymmetric halo by large-angle-tilt implant (AHLATI) MOSFET for high performance and reliability*
dc.typeArticle*
dc.relation.issue4*
dc.relation.volume46*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage820*
dc.relation.lastpage822*
dc.relation.journaltitleIEEE Transactions on Electron Devices*
dc.identifier.doi10.1109/16.753725*
dc.identifier.wosidWOS:000079394700035*
dc.identifier.scopusid2-s2.0-0032650119*
dc.author.googleShin H.*
dc.author.googleLee S.*
dc.contributor.scopusid신형순(7404012125)*
dc.contributor.scopusid이승준(36064894500;57207064952)*
dc.date.modifydate20240322125227*
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공과대학 > 전자전기공학전공 > Journal papers
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