View : 21 Download: 0

Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Title
Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
Authors
Nam D.Opanasyuk A.S.Koval P.V.Ponomarev A.G.Jeong A.R.Kim G.Y.Jo W.Cheong H.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2014
Journal Title
Thin Solid Films
ISSN
0040-6090JCR Link
Citation
vol. 562, pp. 109 - 113
Publisher
Elsevier
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Confocal microscopy; Copper-zinc-tin selenide; Energy dispersive X-ray spectroscopy; Particle induced X-ray emission; Photoluminescence; Raman spectroscopy; Thin films; X-ray diffraction
DOI
10.1016/j.tsf.2014.03.079
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE