DSpace at EWHA: Anomalous drain-induced barrier lowering effect of thin-film transistors due to capacitive coupling voltage of light-shield metal

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DC Field	Value	Language
dc.contributor.author	신형순	*
dc.date.accessioned	2016-08-28T11:08:39Z	-
dc.date.available	2016-08-28T11:08:39Z	-
dc.date.issued	2014	*
dc.identifier.issn	0013-5194	*
dc.identifier.other	OAK-11727	*
dc.identifier.uri	https://dspace.ewha.ac.kr/handle/2015.oak/228079	-
dc.language	English	*
dc.publisher	Institution of Engineering and Technology	*
dc.title	Anomalous drain-induced barrier lowering effect of thin-film transistors due to capacitive coupling voltage of light-shield metal	*
dc.type	Article	*
dc.relation.issue	15	*
dc.relation.volume	50	*
dc.relation.index	SCI	*
dc.relation.index	SCIE	*
dc.relation.index	SCOPUS	*
dc.relation.startpage	1093	*
dc.relation.lastpage	1095	*
dc.relation.journaltitle	Electronics Letters	*
dc.identifier.doi	10.1049/el.2013.3443	*
dc.identifier.wosid	WOS:000340242300035	*
dc.identifier.scopusid	2-s2.0-84904344749	*
dc.author.google	Kim M.	*
dc.author.google	Shin H.	*
dc.contributor.scopusid	신형순(7404012125)	*
dc.date.modifydate	20240322125227	*