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Burn-in for systems operating in a shock environment

Title
Burn-in for systems operating in a shock environment
Authors
Cha J.H.Finkelstein M.
Ewha Authors
차지환
SCOPUS Author ID
차지환scopus
Issue Date
2011
Journal Title
IEEE Transactions on Reliability
ISSN
0018-9529JCR Link
Citation
IEEE Transactions on Reliability vol. 60, no. 4, pp. 721 - 728
Indexed
SCIE; SCOPUS WOS scopus
Document Type
Article
Abstract
Burn-in is a widely used engineering method to eliminate defective items before they are shipped to customers or put into field operation. Burn-in procedures are usually applied to items with high initial failure rate which operate under a static operational environment. In this paper, we consider burn-in for items that operate in an environment with shocks. We assume that there are two competing risk causes of failure: the usual degradations, and environmental shocks. A new type of burn-in via controlled (laboratory) test shocks is considered, and the problem of obtaining the optimal level (severity) of these shocks is investigated. Furthermore, we combine the conventional burn-in procedure with burn-in via shocks in one unified model. © 2011 IEEE.
DOI
10.1109/TR.2011.2161153
Appears in Collections:
자연과학대학 > 통계학전공 > Journal papers
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