Transport characteristics and surface potential distribution of electrically stressed TiO 2 single crystals

Abstract

We investigated transport and local electrical properties of Pt/TiO 2 single crystal/Ti planar junctions with micron-sized gaps between the electrodes. Potential profiles, obtained by scanning Kelvin probe microscopy (SKPM), clearly showed that negative (positive) electrical stress to the Pt electrodes significantly reduced (hardly affected) the Pt/TiO 2 contact resistance. In addition, the SKPM results revealed that the electrical stress caused modification of resistance and local work function of the TiO 2 surface. All the results suggested that the electrical stress caused alteration of physical properties at the TiO 2 surface between the electrodes as well as the Pt/TiO 2 interface. © Springer-Verlag 2011.